Indeed. An old EE mentor told me once that most component aging takes place the first two weeks of operation. If it operates for two weeks, it will probably operate for a long, long time after that. When you’re burning in a piece of gear, it helps the testing process if you put it in a high temperature environment as well (within reason) to place more stress on the components.
The high temperature part is kind of a trap with SSDs: flash memory is easier to write (less likely to error out) at temperatures above 50C, so if you run a write heavy application at higher temperature, it’s less likely to fail than if it was kept colder.
Properly stress testing an SSD would be writing to it while cold (below 20C) and checking read errors while hot (above 60C).
For normal use you’d want the opposite: write hot, read cold.
Indeed. An old EE mentor told me once that most component aging takes place the first two weeks of operation. If it operates for two weeks, it will probably operate for a long, long time after that. When you’re burning in a piece of gear, it helps the testing process if you put it in a high temperature environment as well (within reason) to place more stress on the components.
The high temperature part is kind of a trap with SSDs: flash memory is easier to write (less likely to error out) at temperatures above 50C, so if you run a write heavy application at higher temperature, it’s less likely to fail than if it was kept colder.
Properly stress testing an SSD would be writing to it while cold (below 20C) and checking read errors while hot (above 60C).
For normal use you’d want the opposite: write hot, read cold.